XIS-6545DV
XIS-6545DV
PRODUCT HIGHLIGHTS
- Dual-view imaging
- High-resolution images with 24-bit color
- Enhanced material discrimination
- Windows Operating System with Intel® Core™ Processor
- Real-time diagnostics
- High-contrast image analysis
PRODUCT INFORMATION:
The XIS-6545DV™ is an advanced X-Ray Inspection System (XIS) designed for dual-view x-ray screening. Its powerful dual generators provide upward and diagonal viewing angles of screened objects. Each view can be manipulated independently, allowing operators to perform rapid and in-depth inspections while simultaneously using different screening modes.
With Astrophysics’ best-in-class imaging software, the XIS-6545DV™ allows operators to inspect objects with colorful, high-contrast filters and identify materials, recognize objects, and isolate threats with increased speed and accuracy.
| SPECIFICATIONS | |
|---|---|
| Generator | Dual 180kV |
| Tunnel Size | 65.7 cm x 45.1 cm (25.8" x 17.7") |
| Length | 213.3 cm (83.97") |
| Width | 101.6 cm (40.0") |
| Height | 129.0 cm (50.81") |